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IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 171 - 176
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 180 - 182
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2227 - 2234
2010 3rd International Nanoelectronics Conference (INEC) > 1136 - 1137