Search results for: Mustapha Rafik
Microelectronic Engineering > 2017 > 178 > C > 21-25
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 171 - 176
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 180 - 182
IEEE Electron Device Letters > 2011 > 32 > 8 > 1041 - 1043
The 33rd International Convention MIPRO > 30 - 32