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IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2633 - 2638
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3998 - 4001
IEEE Transactions on Industrial Electronics > 2017 > 64 > 10 > 8334 - 8343
IEEE Transactions on Power Electronics > 2017 > 32 > 6 > 4776 - 4784
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2478 - 2484
IEEE Electron Device Letters > 2017 > 38 > 5 > 677 - 680
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2142 - 2147
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-4.1 - 3E-4.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-1.1 - WB-1.6
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-7.1 - DG-7.5
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-6.1 - DG-6.3
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-1.1 - 4B-1.5
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 163 - 169