Wyniki wyszukiwania
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5057 - 5064
IEEE Transactions on Industrial Electronics > 2017 > 64 > 10 > 8206 - 8212
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3044 - 3055
IEEE Electron Device Letters > 2017 > 38 > 8 > 1059 - 1062
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2970 - 2976
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 3A-3.1 - 3A-3.6
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-1.1 - CR-1.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1189 - 1192
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 253 - 259
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 190 - 191