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2011 International Reliability Physics Symposium > 4A.5.1 - 4A.5.5
2011 International Reliability Physics Symposium > 2A.3.1 - 2A.3.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 461 - 463
IEEE Electron Device Letters > 2011 > 32 > 6 > 740 - 742
IEEE Electron Device Letters > 2011 > 32 > 6 > 707 - 709
IEEE Electron Device Letters > 2011 > 32 > 4 > 569 - 571
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 953 - 959
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 617 - 622
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2094 - 2103
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 107 - 114
IEEE Electron Device Letters > 2011 > 32 > 5 > 686 - 688
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 74 - 79
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130