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IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4831 - 4837
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4838 - 4843
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3998 - 4001
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3582 - 3587
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3316 - 3323
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1519 - 1527
IEEE Electron Device Letters > 2016 > 37 > 7 > 831 - 834
IEEE Electron Device Letters > 2016 > 37 > 3 > 253 - 256
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 558 - 564
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3575 - 3580
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3567 - 3574
IEEE Transactions on Nanotechnology > 2015 > 14 > 5 > 878 - 882
IEEE Electron Device Letters > 2015 > 36 > 8 > 751 - 753