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IEEE Journal of the Electron Devices Society > 2017 > 5 > 5 > 347 - 361
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3151 - 3158
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 307 - 313
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 793 - 800
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.4.1 - 5E.4.4
2013 Spanish Conference on Electron Devices > 281 - 284
IEEE Electron Device Letters > 2013 > 34 > 3 > 387 - 389
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 70 - 77
COMMAD 2012 > 121 - 122
2012 International Electron Devices Meeting > 9.5.1 - 9.5.4
2012 IEEE International Reliability Physics Symposium (IRPS) > MY.4.1 - MY.4.4