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IEEE Transactions on Industrial Electronics > 2017 > 64 > 1 > 206 - 216
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 549 - 555
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 1947 - 1955
IEEE Electron Device Letters > 2016 > 37 > 2 > 205 - 208
2015 IEEE International Electron Devices Meeting (IEDM) > 22.7.1 - 22.7.4
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2588 - 2594
2013 IEEE International Electron Devices Meeting > 7.3.1 - 7.3.4
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.2.1 - EL.2.6
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.5.1 - EL.5.5
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 10 - 14
IEEE Electron Device Letters > 2011 > 32 > 10 > 1421 - 1423
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2944 - 2951
EOS/ESD Symposium Proceedings > 1 - 8
IEEE Transactions on Microwave Theory and Techniques > 2010 > 58 > 12-2 > 4004 - 4011
2009 31st EOS/ESD Symposium > 1 - 6
2009 31st EOS/ESD Symposium > 1 - 10