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IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3654 - 3660
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 145 - 152
IEEE Electron Device Letters > 2015 > 36 > 12 > 1340 - 1343
2015 IEEE International Electron Devices Meeting (IEDM) > 28.2.1 - 28.2.4
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2078 - 2084
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 863 - 869
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3465 - 3473
IEEE Transactions on Electron Devices > 2013 > 60 > 9 > 2827 - 2833
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 705 - 709
IEEE Electron Device Letters > 2011 > 32 > 11 > 1546 - 1548
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 112 - 117
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2610 - 2619
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3463 - 3471
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1102 - 1107
IEEE Transactions on Electron Devices > 2010 > 57 > 5 > 986 - 994
IEEE Transactions on Electron Devices > 2007 > 54 > 9 > 2362 - 2368