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IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2964 - 2972
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 378 - 386
2011 24th Internatioal Conference on VLSI Design > 130 - 134
2009 46th ACM/IEEE Design Automation Conference > 551 - 556