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2008 3rd International Design and Test Workshop > 148 - 153
IET Computers & Digital Techniques > 2008 > 2 > 3 > 172 - 183
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2005 > 13 > 7 > 794 - 807
2008 3rd International Design and Test Workshop > 148 - 153
IET Computers & Digital Techniques > 2008 > 2 > 3 > 172 - 183
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2005 > 13 > 7 > 794 - 807