Search results for: F. Clermidy
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-2.1 - PM-2.5
2016 IEEE International Electron Devices Meeting (IEDM) > 35.1.1 - 35.1.4
2014 IEEE International Electron Devices Meeting > 6.5.1 - 6.5.4
2014 IEEE International Electron Devices Meeting > 6.3.1 - 6.3.4
Thin Solid Films > 2014 > 563 > Complete > 15-19
IEEE Transactions on Circuits and Systems II: Express Briefs > 2013 > 60 > 6 > 356 - 360