Search results
IEEE Electron Device Letters > 2016 > 37 > 12 > 1632 - 1635
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-3-1 - 4B-3-5
IEEE Transactions on Plasma Science > 2014 > 42 > 12-1 > 3825 - 3829
IEEE Electron Device Letters > 2014 > 35 > 7 > 723 - 725
IEEE Transactions on Plasma Science > 2014 > 42 > 12-1 > 3722 - 3725
IEEE Electron Device Letters > 2013 > 34 > 10 > 1289 - 1291
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 56 - 62
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 122 - 131
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1798 - 1803
2010 International Electron Devices Meeting > 26.4.1 - 26.4.4
IEEE Electron Device Letters > 2010 > 31 > 9 > 1035 - 1037