Search results
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 110 - 115
IEEE Electron Device Letters > 2018 > 39 > 1 > 79 - 82
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4875 - 4881
IEEE Electron Device Letters > 2017 > 38 > 10 > 1441 - 1444
IEEE Electron Device Letters > 2017 > 38 > 10 > 1409 - 1412
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4057 - 4064
IEEE Electron Device Letters > 2017 > 38 > 10 > 1421 - 1424
IEEE Electron Device Letters > 2017 > 38 > 10 > 1425 - 1428
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4044 - 4049
IEEE Electron Device Letters > 2017 > 38 > 10 > 1417 - 1420
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3139 - 3144
IEEE Electron Device Letters > 2017 > 38 > 5 > 615 - 618
IEEE Electron Device Letters > 2017 > 38 > 5 > 596 - 599
IEEE Electron Device Letters > 2017 > 38 > 5 > 611 - 614
Solid-State Electronics > 2017 > 130 > C > 28-32
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1197 - 1202
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 840 - 847