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IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3751 - 3756
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3090 - 3095
IEEE Electron Device Letters > 2014 > 35 > 10 > 983 - 985
IEEE Sensors Journal > 2013 > 13 > 6 > 2066 - 2076
2012 IEEE International Reliability Physics Symposium (IRPS) > 2E.3.1 - 2E.3.9
2012 IEEE International Reliability Physics Symposium (IRPS) > 2E.4.1 - 2E.4.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 6A.3.1 - 6A.3.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 2B.3.1 - 2B.3.5
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2033 - 2036
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 94 - 100
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 590 - 595
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 171 - 178
IEEE Electron Device Letters > 2011 > 32 > 1 > 81 - 83
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2544 - 2550