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IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
2017 IEEE International Reliability Physics Symposium (IRPS) > 2E-4.1 - 2E-4.8
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-2.1 - 2D-2.7
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1455 - 1466
2016 IEEE International Reliability Physics Symposium (IRPS) > CR-2-1 - CR-2-4
2012 IEEE International Reliability Physics Symposium (IRPS) > 6A.3.1 - 6A.3.6
2010 International Electron Devices Meeting > 4.3.1 - 4.3.4
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 4 > 482 - 491
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 228 - 237