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2017 IEEE International Reliability Physics Symposium (IRPS) > XT-3.1 - XT-3.5
IEEE Electron Device Letters > 2017 > 38 > 3 > 345 - 348
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 480 - 484
Journal of Display Technology > 2016 > 12 > 3 > 268 - 272
IEEE Electron Device Letters > 2016 > 37 > 3 > 291 - 294
2015 IEEE International Electron Devices Meeting (IEDM) > 21.5.1 - 21.5.4