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2016 IEEE International Electron Devices Meeting (IEDM) > 11.3.1 - 11.3.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 362 - 369
2012 IEEE International Reliability Physics Symposium (IRPS) > 2A.1.1 - 2A.1.7
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2361 - 2369