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2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
IEEE Transactions on Electron Devices > 2012 > 59 > 2 > 269 - 276
IEEE Electron Device Letters > 2012 > 33 > 7 > 931 - 933
2011 International Reliability Physics Symposium > 5D.4.1 - 5D.4.7
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1295 - 1301
IEEE Electron Device Letters > 2011 > 32 > 4 > 446 - 448
IEEE Electron Device Letters > 2011 > 32 > 9 > 1173 - 1175
2010 International Electron Devices Meeting > 6.4.1 - 6.4.4
2010 International Electron Devices Meeting > 34.4.1 - 34.4.4
2010 International Electron Devices Meeting > 18.5.1 - 18.5.4
IEEE Transactions on Electron Devices > 2008 > 55 > 4 > 961 - 967