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Based on minimum reconstruction error criterion and the intrinsic sparse property of natural data, sparse representation (SR) has shown promising performance on various image recognition tasks. However, in the field of person re-identification (re-id), the state-of-the-art is still dominated by other methods such as metric learning or CNN. It is because samples in one view may not be representative...
The process of testing any software system is an atrocious task which indeed consumes a ton of effort, and expensive also. Required effort and time to do adequate as well as effective testing get bigger, as the software gets more complexed that can lead to swarm over the project budget or some test cases left uncovered or delay in completion. A suitably generated test suite does not only locate errors...
In order to improve the reliability of electronic products and reduce the probability of failure of spare parts, this paper proposes a method of using alternation to detect electronic products regularly. Firstly, we regard the original element and the spare part as the reserve system and consider the fault of the elements caused by human error at the same time. Secondly, we take the Alternate interval...
The paper is devoted to the problem of the active components (transistors) automated diagnostics on the base of his current-voltage characteristics and passive radio components (resistors) the prediction class by his parameters. The procedure of identification on the neuron nets base for these transistors is proposed. For automated diagnostic of passive radio components, for example, resistors, the...
The performance of Monte-Carlo Simulation(MCS) is highly related to the number of simulation. This paper introduces a hypothesis testing technique and incorporated into a Particle Swarm Optimization(PSO) based Monte-Carlo Simulation(MCS) algorithm to solve the complex network reliability problem. The function of hypothesis testing technique is to reduce the dispensable simulation in network system...
The randomness of random number generators (RNGs) significantly influences the security of cryptographic systems. Although RNGs are allowed to adopt in practical systems only after strict analysis and security evaluation, the randomness of generated sequences may degrade due to aging effects of electronic devices, change of temperature and humidity, or even malicious attacks. Therefore, before the...
As device dimension shrinks less than 65nm, the propagation delay, crosstalk noises, and power dissipation due to RC (Resistance Capacitance) coupling becomes significant. Cu and LK (Low-k dielectric) material have been introduced to reduce such delays and allow higher device speed and better performance. However, since dielectric material with low-k value usually possesses large amount of porosity,...
This paper describes an optimal accelerated test plan considering an economic approach. We introduce a general framework to obtain plans of optimal accelerate tests with a specific objective, such as cost. The optimal test plans are defined by considering prior knowledge of reliability, including the reliability function and its scale and shape parameters, and the appropriate model to characterize...
Under condition of market economy, long-term maintenance costs of the equipment should become the optimization goal of fully-mechanized coal mining machinery parts management. Using the average loss optimization model with consideration of reliability analysis, the minimum average loss oriented parts replacement cycle was solved and an actual example was given. In the end, a conclusion was draw that...
Reliability is a main technical index for aircraft of long life cycle and long storage period. Periodic test is a reasonable confirmation for keep a good reliability of aircraft system. If inspection and maintenance periodically is too long or short, it may exercise an influence upon low reliability and high economy. So, the optimal testing period is the effective way for a good reliability of aircraft...
This article describes the advanced parametric models for assessment and prediction of software reliability, based on statistics of bugs at the initial stage of testing. The parametric model approach, commonly associated with reliability issues, deals with the evaluation of the amount of bugs in the code. Computed parameter values inserted into the model allow to estimate: (a) number of bugs remaining...
A recent paper (Spall, 2009) introduced a method for estimating the reliability of a complex system based on a combination of full system and subsystem (and/or component or other) tests. It is assumed that the system is composed of multiple subsystems, where the subsystems may be arranged in series, parallel (i.e., redundant), combination series/parallel, or other mode. Maximum likelihood estimation...
This paper describes the development of adaptive test in response to the ever growing need to dynamically and cost effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of it's use. Finally, challenges for future development are discussed.
With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efficient techniques for analyzing and optimizing circuits for reliability. To address this problem, we propose an exact analysis method based on circuit transformations. Also, we propose a hybrid method that combines exact analysis...
Variations in power supply voltage, which is a function of the power delivery network and dynamic current consumption, can affect circuit reliability. Much work has been done to understand power delivery robustness during both the design phase as well as the post-silicon validation phase. Methods applicable at the design phase typically synthesize worst-case current waveforms based on simple current...
We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly...
Sets of Pairs of Functions to be Distinguished (SPFD) is a functional flexibility representation method that was recently introduced in the logic synthesis domain, and promises superiority in exploring the flexibility offered by a design over all previous representation methods. In this work, we illustrate how the SPFD of a particular wire reveals information regarding the number of potential transient...
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect...
In this paper a BISR architecture for embedded memories is presented. The proposed scheme utilises a multiple bank cache-like memory for repairs. Statistical analysis is used for minimisation of the total resources required to achieve a very high fault coverage. Simulation results show that the proposed BISR scheme is characterised by high efficiency and low area overhead, even for high defect densities...
In this paper we propose a set of different configurations of failure recovery schemes, developed for network-on-chip (NoC) based systems. These configurations exploit the fact that communication in NoCs tends to be partitioned and eventually localized. The failure recovery approach is based on checkpoint and rollback and is aimed towards fast recovery from system or application level failures. The...
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