IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 277 - 282
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 117 - 122
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 79 - 97
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 394 - 405
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 1 > 74 - 79
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 135 - 144
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 171 - 179
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 128 - 134
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 147 - 162
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 180 - 189
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 305 - 310
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 203 - 208
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 237 - 243
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 163 - 170
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 454 - 458
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 537 - 556
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 123 - 129
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 201 - 207