IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 288 - 291
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 169 - 174
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 534 - 541
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 373 - 378
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 278 - 284
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 347 - 350
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 333 - 339
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 438 - 445
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 462 - 467
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 611 - 616
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 145 - 152
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 98 - 121
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 193 - 202
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 352 - 357
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 394 - 405
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 652 - 663
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 689 - 693
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 635 - 641
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 171 - 179
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 318 - 324