Search results for: Ching-Chieh Shih
IEEE Electron Device Letters > 2010 > 31 > 12 > 1413 - 1415
IEEE Electron Device Letters > 2009 > 30 > 8 > 834 - 836
IEEE Electron Device Letters > 2009 > 30 > 4 > 368 - 370
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 347 - 350