Search results for: R.J.O.M. Hoofman
Microelectronic Engineering > 2008 > 85 > 10 > 2071-2074
Microelectronic Engineering > 2007 > 84 > 9-10 > 2177-2183
Microelectronic Engineering > 2006 > 83 > 11-12 > 2150-2154
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 169 - 174
Microelectronic Engineering > 2005 > 82 > 3-4 > 321-332
Microelectronic Engineering > 2005 > 80 > Complete > 337-344
Microelectronics Reliability > 2004 > 44 > 12 > 2011-2017
Synthetic Metals > 1999 > 102 > 1-3 > 1417-1418
Synthetic Metals > 1997 > 86 > 1-3 > 2355-2356