IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 163 - 168
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 175 - 180
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 162 - 174
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 236 - 241
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 298 - 303
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 259 - 269
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 356 - 362
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 270 - 277
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 222 - 228
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 210 - 215
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 216 - 221
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 442 - 448
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 652 - 663
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 680 - 688
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 1 > 87 - 97
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 1 > 9 - 19
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 1 > 20 - 30
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 103
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 244 - 254
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105