Search results for: E. Zschech
Journal of Power Sources > 2018 > 373 > C > 85-94
Ultramicroscopy > 2018 > 184 > PB > 52-56
Journal of Magnetism and Magnetic Materials > 2017 > 421 > C > 19-24
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 455 - 460
Microelectronics Reliability > 2016 > 64 > C > 390-392
Engineering Materials and Processes > Materials for Information Technology > Advanced Materials Characterization > 485-495
Engineering Materials and Processes > Materials for Information Technology > Materials for Interconnects > 241-249
Ultramicroscopy > 2016 > 162 > C > 82-90
Microelectronics Reliability > 2014 > 54 > 9-10 > 1959-1962
2013 IEEE International Reliability Physics Symposium (IRPS) > 2C.1.1 - 2C.1.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.1.1 - 2F.1.5
Przegląd Elektrotechniczny > 2012 > R. 88, nr 10b > 64-66
Thin Solid Films > 2010 > 519 > 1 > 203-209