Search results for: J.D. Rowatt
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 222 - 228
Structural Safety > 1998 > 20 > 2 > 117-135
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 222 - 228
Structural Safety > 1998 > 20 > 2 > 117-135