Search results for: Chang-Hsien Lin
2016 IEEE International Electron Devices Meeting (IEDM) > 2.3.1 - 2.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 14.3.1 - 14.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 16.1.1 - 16.1.4
2015 IEEE International Electron Devices Meeting (IEDM) > 32.2.1 - 32.2.4
2015 IEEE International Electron Devices Meeting (IEDM) > 22.6.1 - 22.6.4
2014 IEEE International Electron Devices Meeting > 33.5.1 - 33.5.4
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 897 - 901
2013 IEEE International Reliability Physics Symposium (IRPS) > ME.1.1 - ME.1.4
IEEE Electron Device Letters > 2012 > 33 > 4 > 591 - 593
2011 International Electron Devices Meeting > 27.6.1 - 27.6.4