Search results for: G. Groeseneken
2011 International Reliability Physics Symposium > XT.3.1 - XT.3.5
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
2011 International Reliability Physics Symposium > 4A.2.1 - 4A.2.8
2011 International Reliability Physics Symposium > 2D.3.1 - 2D.3.6
2011 International Reliability Physics Symposium > XT.4.1 - XT.4.6
2011 International Reliability Physics Symposium > 2A.2.1 - 2A.2.10
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 278 - 289
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1490 - 1498
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2061 - 2071
EOS/ESD Symposium Proceedings > 1 - 8
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4
2010 International Electron Devices Meeting > 35.5.1 - 35.5.4
2010 International Electron Devices Meeting > 28.4.1 - 28.4.4
Microelectronic Engineering > 2010 > 87 > 12 > 2614-2619