Search results for: G. Groeseneken
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.1.1 - 5D.1.10
IEEE Electron Device Letters > 2012 > 33 > 12 > 1681 - 1683
Microelectronic Engineering > 2009 > 86 > 7-9 > 1582-1584
IEEE Electron Device Letters > 2008 > 29 > 12 > 1364 - 1366
IEEE Electron Device Letters > 2008 > 29 > 12 > 1398 - 1401
Microelectronic Engineering > 2007 > 84 > 9-10 > 2067-2070
Solid State Electronics > 2007 > 51 > 8 > 1101-1108