Search results for: Yi Lin
2016 IEEE International Electron Devices Meeting (IEDM) > 33.1.1 - 33.1.4
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4179 - 4184
IEEE Electron Device Letters > 2015 > 36 > 10 > 1060 - 1062
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2675 - 2678
IEEE Electron Device Letters > 2015 > 36 > 2 > 105 - 107
2013 IEEE International Reliability Physics Symposium (IRPS) > ME.1.1 - ME.1.4
IEEE Electron Device Letters > 2012 > 33 > 4 > 591 - 593
2010 International Electron Devices Meeting > 36.2.1 - 36.2.4
Journal of Materials Processing Tech. > 2008 > 208 > 1-3 > 35-41
IEEE Electron Device Letters > 2008 > 29 > 2 > 165 - 167
IEEE Electron Device Letters > 2008 > 29 > 11 > 1232 - 1235
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1360 - 1365