Search results for: W.-E. Wang
IEEE Electron Device Letters > 2017 > 38 > 3 > 314 - 317
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 507 - 514
2012 International Electron Devices Meeting > 27.1.1 - 27.1.3
2011 International Electron Devices Meeting > 35.3.1 - 35.3.4
2011 International Electron Devices Meeting > 28.6.1 - 28.6.4
2011 International Electron Devices Meeting > 18.5.1 - 18.5.4
Journal of Crystal Growth > 2011 > 323 > 1 > 99-102
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 3890 - 3897
2010 International Electron Devices Meeting > 10.6.1 - 10.6.4
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4
Journal of Nuclear Materials > 1997 > 246 > 1 > 43-52