Search results for: T. Carriere
Microelectronics Reliability > 2015 > 55 > 9-10 > 1491-1495
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2789 - 2796
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 1032 - 1039
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 813 - 819
Journal of Oral and Maxillofacial Surgery > 2010 > 68 > 2 > 260-267
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 2970 - 2974
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3146 - 3150
IEEE Transactions on Nuclear Science > 2008 > 55 > 4-1 > 2166 - 2173
IEEE Transactions on Nuclear Science > 2008 > 55 > 4-1 > 2007 - 2012
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1897 - 1901
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1863 - 1870
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1890 - 1896
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1876 - 1882