Search results for: A Douin
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 813 - 819
Microelectronics Reliability > 2007 > 47 > 9-11 > 1836-1840
Microelectronics Reliability > 2006 > 46 > 9-11 > 1514-1519
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1799 - 1805