Search results for: Aaron Voon‐Yew Thean
Advanced Functional Materials > 31 > 24 > n/a - n/a
International Journal of RF and Microwave Computer‐Aided Engineering > 28 > 5 > n/a - n/a
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2970 - 2976
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1669 - 1680
physica status solidi (a) > 214 > 3 > n/a - n/a
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4632 - 4641
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4248 - 4254
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 4031 - 4037
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2671 - 2676
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2930 - 2935
IEEE Electron Device Letters > 2016 > 37 > 4 > 482 - 485
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1658 - 1665
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 643 - 651
IEEE Transactions on Electron Devices > 2016 > 63 > 1 > 265 - 271
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3125 - 3132
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2078 - 2083