Search results for: H. Chen
IEEE Electron Device Letters > 2017 > 38 > 9 > 1224 - 1227
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
IEEE Transactions on Circuits and Systems II: Express Briefs > 2014 > 61 > 5 > 299 - 303
2013 IEEE International Electron Devices Meeting > 2.6.1 - 2.6.4
2013 IEEE International Reliability Physics Symposium (IRPS) > BD.3.1 - BD.3.5
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
IEEE Transactions on Nuclear Science > 2010 > 57 > 2-1 > 456 - 462
2009 16th IEEE-NPSS Real Time Conference > 129 - 136