Search results for: U. Gösele
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Silicon-Germanium Alloys > 103-106
Thin Solid Films > 2010 > 518 > 9 > 2555-2561
physica status solidi c > 7 > 2 > 444 - 447
physica status solidi (b) > 247 > 2 > 347 - 352
physica status solidi (b) > 247 > 2 > n/a - n/a
physica status solidi c > 7 > 1 > 44 - 47
physica status solidi (a) > 207 > 1 > 29 - 32
Journal of Electronic Materials > 2010 > 39 > 5 > 482-488
Journal of Electronic Materials > 2010 > 39 > 10 > 2177-2189
Journal of Crystal Growth > 2009 > 311 > 11 > 3216-3219
Nuclear Inst. and Methods in Physics Research, B > 2009 > 267 > 8-9 > 1264-1268
Microelectronics Journal > 2009 > 40 > 3 > 452-455
Applied Physics A > 2008 > 93 > 2 > 399-403
Applied Physics A > 2008 > 93 > 2 > 577-577
Applied Physics A > 2008 > 90 > 4 > 591-596
Applied Physics A > 2008 > 91 > 1 > 7-12
Solid State Communications > 2007 > 143 > 11-12 > 570-573