Search results for: Yong Kang
IEEE Electron Device Letters > 2009 > 30 > 12 > 1365 - 1367
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 171 - 179
IEEE Electron Device Letters > 2009 > 30 > 5 > 523 - 525
IEEE Electron Device Letters > 2009 > 30 > 12 > 1365 - 1367
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 171 - 179
IEEE Electron Device Letters > 2009 > 30 > 5 > 523 - 525