Search results for: Javier A. Salcedo
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-4.1 - EL-4.4
IEEE Electron Device Letters > 2016 > 37 > 11 > 1477 - 1480
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-4-1 - EL-4-3
2015 IEEE International Reliability Physics Symposium > EL.3.1 - EL.3.5
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1061 - 1067
IEEE Electron Device Letters > 2014 > 35 > 4 > 437 - 439
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 772 - 774
IEEE Electron Device Letters > 2013 > 34 > 2 > 178 - 180
IEEE Electron Device Letters > 2012 > 33 > 11 > 1595 - 1597
IEEE Electron Device Letters > 2012 > 33 > 6 > 860 - 862