The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In situ lift out is a mature and well established technique for TEM sample preparation [1]. There are occasions though, when lift out fails, and the TEM lamella falls into the TEM trench during sample preparation. In a previous study [2], the lamella can be rescued through a series of steps involving welding, tilting, cutting free and rewelding the lamella onto a grid or die. In this paper, we detail...
In this paper, a method to detect shorts at the gates of the storage node of a 6T SRAM bit cell via atomic force probing (AFP) at the Via 1 level is discussed. This method is useful for the preservation of physical evidence as well as to ease the probing operation due to the lower density and larger separations of vias compared to contacts. One particular case of single bit failure is documented,...
We present Stork — an extension of the EPC C1G2 protocol allowing streaming of data to multiple Computational Radio Frequency IDentification tags (CRFIDs) simultaneously at up to 20 times faster than the prior state of the art. Stork introduces downstream attributes never before seen in (C)RFIDs: (i) fast feedback for CRFID downstream verification based on the internal EPC C1G2 memory check command...
Under non-optimized wafer probe and wire bonding conditions, pad cratering/interlevel dielectric (ILD) cracks may result in an electrical failure. The conventional procedures to analyse these failures include fault localization, optical inspection, SEM inspection and Focused Ion Beam cross-section, which can be very time consuming. In this paper, we introduce a method to detect these failure more...
Occurrences of failure recovery in the course of failure analysis work are not uncommon. Despite this, successful identification of the failure mechanism is still possible in some cases based on available data up to the point of failure recovery, circuit layout knowledge and a combination of a few conventional failure analysis techniques.
Computational RFID (CRFID) devices are emerging platforms that can enable perennial computation and sensing by eliminating the need for batteries. Although much research has been devoted to improving upstream (CRFID to RFID reader) communication rates, the opposite direction has so far been neglected, presumably due to the difficulty of guaranteeing fast and error-free transfer amidst frequent power...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.