Search results for: Pei-Ying Du
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 121 - 129
2015 IEEE International Electron Devices Meeting (IEDM) > 3.2.1 - 3.2.4
2014 IEEE International Electron Devices Meeting > 19.6.1 - 19.6.4
2013 IEEE International Electron Devices Meeting > 3.7.1 - 3.7.4
2013 5th IEEE International Memory Workshop > 139 - 142
2012 International Electron Devices Meeting > 9.1.1 - 9.1.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 6C.2.1 - 6C.2.6
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 222 - 232