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To be compliant with electromagnetic compatibility standards, integrated circuits such as microcontrollers have to be robust to fast transient burst tests. Because of high voltage and fast transient voltage variations used no measurement is possible during the stress. Lack of information makes the debug of a product a real challenge. The objective of this work is to provide a measurement method which...
To be compliant with electromagnetic compatibility standards, integrated circuits such as microcontrollers have to be robust to fast transient burst tests. The supply pins, their numbers and their respective positions, can have an influence on the robustness of circuits on ESD (ElectroStatic Discharges) and FTB (Fast Transient burst) tests. For cost reasons, this number of supply pins tends to be...
This paper presents a full electromagnetic interference (EMI) study of high-performances 32-bit microcontrollers (MCU). First, two types of standard radiated emissions measurements have been executed on a device. Then, EMI modeling has been simulated with the help of a predictive SPICE model. Finally, modifications has been studied and implemented in order to reduce the EMI levels. The aim of this...
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