Search results for: Uwe Paschen
Solid-State Electronics > 2017 > 130 > C > 4-8
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 21 - 29
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 846 - 849
2011 IEEE SENSORS Proceedings > 1600 - 1603
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 81 - 85
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2227 - 2234
Microelectronics Reliability > 2006 > 46 > 12 > 1980-2005