Search results for: Sung-Kye Park
IEEE Electron Device Letters > 2017 > 38 > 2 > 164 - 167
IEEE Electron Device Letters > 2016 > 37 > 11 > 1418 - 1421
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3521 - 3526
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1041 - 1046
IEEE Electron Device Letters > 2015 > 36 > 12 > 1318 - 1320
2015 IEEE International Electron Devices Meeting (IEDM) > 7.2.1 - 7.2.4
2015 IEEE International Electron Devices Meeting (IEDM) > 26.6.1 - 26.6.4
IEEE Electron Device Letters > 2015 > 36 > 6 > 561 - 563
Solid State Electronics > 2014 > 94 > Complete > 51-55
Microelectronics Reliability > 2013 > 53 > 9-11 > 1338-1341
2013 IEEE International Reliability Physics Symposium (IRPS) > 3B.2.1 - 3B.2.4
2012 International Electron Devices Meeting > 9.3.1 - 9.3.4
2012 International Electron Devices Meeting > 9.4.1 - 9.4.4