Search results for: Jun Yeong Lim
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 319 - 325
Microelectronics Reliability > 2015 > 55 > 9-10 > 1320-1322
Microelectronics Reliability > 2015 > 55 > 5 > 795-798
Solid State Electronics > 2014 > 94 > Complete > 51-55
Microelectronics Reliability > 2013 > 53 > 9-11 > 1338-1341