Search results for: J.-M. Portal
Microelectronics Reliability > 2016 > 64 > C > 59-62
Lecture Notes in Computer Science > Field-Programmable Logic and Applications From FPGAs to Computing Paradigm > 139-148
2016 IEEE International Reliability Physics Symposium (IRPS) > 7B-4-1 - 7B-4-7
Journal of Electronic Testing > 2016 > 32 > 1 > 21-30
2015 IEEE International Electron Devices Meeting (IEDM) > 17.2.1 - 17.2.4
Electronics Letters > 2015 > 51 > 6 > 521 - 523
Solid State Electronics > 2015 > 103 > Complete > 73-78