Search results for: Ravi Achanta
2014 IEEE International Electron Devices Meeting > 34.7.1 - 34.7.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 133 - 138
2012 IEEE International Reliability Physics Symposium (IRPS) > BD.2.1 - BD.2.4
Journal of Non-Crystalline Solids > 2004 > 350 > Complete > 336-344