Search results for: James H. Stathis
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 23 - 30
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-4.1 - 2D-4.7
2016 IEEE International Electron Devices Meeting (IEDM) > 15.4.1 - 15.4.4
2015 IEEE International Reliability Physics Symposium > 4A.5.1 - 4A.5.7
2014 IEEE International Electron Devices Meeting > 34.7.1 - 34.7.4
2014 IEEE International Electron Devices Meeting > 20.6.1 - 20.6.4
2014 IEEE International Reliability Physics Symposium > 5B.2.1 - 5B.2.7
IEEE Electron Device Letters > 2013 > 34 > 7 > 837 - 839
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 338 - 339
2010 IEEE International Reliability Physics Symposium > 1099 - 1104
Microelectronic Engineering > 2009 > 86 > 7-9 > 1888-1890
Microelectronics Reliability > 2009 > 49 > 6 > 642-649
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 508
Physica B: Physics of Condensed Matter > 1999 > 273-274 > Complete > 1022-1026