Search results for: C. Lopez-Ongil
Microelectronics Journal > 2014 > 45 > 10 > 1354-1360
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2813 - 2818
Microprocessors and Microsystems > 2012 > 36 > 5 > 334-343
Journal of Electronic Testing > 2012 > 28 > 6 > 777-789
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 1053 - 1058