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This paper proposes the use of an FPGA-based fault injection technique, AMUSE, to study the effect of malicious attacks on cryptographic circuits. Originally, AMUSE was devised to analyze the soft error effects (SEU and SET) in digital circuits. However, many of the fault-based attacks used in cryptanalysis produce faults that can be modeled as bit-flip in memory elements or transient pulses in combinational...
Single Event Transients (SETs) are a concern in digital circuits using nanometric technologies. Proposed solutions include the insertion of pulse filtering cells in the circuit, like some C-Element based cells. These filters are usually introduced at flip-flop inputs. In general, protecting every flip-flop with SET filters is a very costly solution in terms of area. Selective hardening of critical...
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